ISTFA 2014: proceedings from the 40th International Symposium for Testing and Failure Analysis
ASM International
November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community.
The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community.
The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis
Kateqoriyalar:
İl:
2014
Nəşr:
1
Nəşriyyat:
ASM International
Dil:
english
Səhifələr:
560
ISBN 10:
1680155148
ISBN 13:
9781680155143
Fayl:
PDF, 57.83 MB
IPFS:
,
english, 2014